"Designing for scan test of high performance embedded memories."

E. Kofi Vida-Torku, George Joos (1998)

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DOI: 10.1109/TEST.1998.743142

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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E. Kofi Vida-Torku, George Joos:
Designing for scan test of high performance embedded memories. ITC 1998: 101-108

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