"Stimulus generation for built-in self-test of charge-pump phase-locked loops."

Benoît R. Veillette, Gordon W. Roberts (1998)

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DOI: 10.1109/TEST.1998.743214

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Benoît R. Veillette, Gordon W. Roberts:
Stimulus generation for built-in self-test of charge-pump phase-locked loops. ITC 1998: 698-707

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