"Drive only at speed functional testing; one of the techniques Intel is ..."

Mike Tripp, Silvio Picano, Baruch Schnarch (2005)

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DOI: 10.1109/TEST.2005.1583969

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mike Tripp, Silvio Picano, Baruch Schnarch:
Drive only at speed functional testing; one of the techniques Intel is using to control test costs. ITC 2005: 8

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