"Test Pattern Generation for Circuits with Asynchronous Signals Based on Scan."

Mitsuo Teramoto, Tomoo Fukazawa (1996)

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DOI: 10.1109/TEST.1996.556939

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mitsuo Teramoto, Tomoo Fukazawa:
Test Pattern Generation for Circuits with Asynchronous Signals Based on Scan. ITC 1996: 21-28

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