"Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test."

Bambang Suparjo et al. (2006)

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DOI: 10.1109/TEST.2006.297708

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg:
Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. ITC 2006: 1-9

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