"Analysis and Definition of Overall Timing Accuracy in VLSI Test System."

Shigeru Sugamori et al. (1981)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-10-22

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  dblp key:
  - conf/itc/SugamoriYMKS81
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  persistent URL:
  - https://dblp.org/rec/conf/itc/SugamoriYMKS81
Shigeru Sugamori, Kenji Yoshida, Hiromi Maruyama, Shinpei Kamata, Tsuneta Sudo:
Analysis and Definition of Overall Timing Accuracy in VLSI Test System. ITC 1981: 143-153

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