"Stuck Fault and Current Testing Comparison Using CMOS Chip Test."

Thomas M. Storey et al. (1991)

> Home

Details and statistics

DOI: 10.1109/TEST.1991.519523

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/StoreyMAM91
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/StoreyMAM91
Thomas M. Storey, Wojciech Maly, John Andrews, Myron Miske:
Stuck Fault and Current Testing Comparison Using CMOS Chip Test. ITC 1991: 311-318

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.