"Electrical Characteristics and Testing Considerations for Gate Oxide ..."

Jerry M. Soden, Charles F. Hawkins (1985)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-11

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Jerry M. Soden, Charles F. Hawkins:
Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. ITC 1985: 544-557

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