"Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail?"

Mustapha Slamani (2005)

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DOI: 10.1109/TEST.2005.1584123

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mustapha Slamani:
Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail? ITC 2005: 1

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