"Artificial Neural Network Based Test Escape Screening Using Generative Model."

Michihiro Shintani, Michiko Inoue, Yoshiyuki Nakamura (2018)

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DOI: 10.1109/TEST.2018.8624821

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Michihiro Shintani, Michiko Inoue, Yoshiyuki Nakamura:
Artificial Neural Network Based Test Escape Screening Using Generative Model. ITC 2018: 1-8

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