"New Paradigm for Signal Paths in ATE Pin Electronics are Needed for ..."

Masashi Shimanouchi (2002)

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DOI: 10.1109/TEST.2002.1041845

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Masashi Shimanouchi:
New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing. ITC 2002: 903-912

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