"Fault simulation for analog test coverage."

Jyotsna Sequeira et al. (2016)

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DOI: 10.1109/TEST.2016.7805831

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Jyotsna Sequeira, Suriyaprakash Natarajan, Prashant Goteti, Nitin Chaudhary:
Fault simulation for analog test coverage. ITC 2016: 1-7

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