"On-Chip Mixed-Signal Test Structures Re-used for Board Test."

Rodger Schuttert, D. C. L. (Erik) van Geest, A. Kumar (2004)

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DOI: 10.1109/TEST.2004.1386973

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Rodger Schuttert, D. C. L. (Erik) van Geest, A. Kumar:
On-Chip Mixed-Signal Test Structures Re-used for Board Test. ITC 2004: 375-383

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