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"An evaluation of defect-oriented test: WELL-controlled low voltage test."
Yasuo Sato et al. (2001)
- Yasuo Sato, Masaki Kohno, Toshio Ikeda, Iwao Yamazaki, Masato Hamamoto:
An evaluation of defect-oriented test: WELL-controlled low voltage test. ITC 2001: 1059-1067
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