"RT-level design-for-testability and expansion of functional test sequences ..."

Alodeep Sanyal et al. (2010)

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DOI: 10.1109/TEST.2010.5699266

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Alodeep Sanyal, Krishnendu Chakrabarty, Mahmut Yilmaz, Hideo Fujiwara:
RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage. ITC 2010: 625-634

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