"A Learning-Based Method to Match a Test Pattern Generator to a ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Irith Pomeranz, Sudhakar M. Reddy (1993)

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DOI: 10.1109/TEST.1993.470599

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/itc/PomeranzR93
Irith Pomeranz, Sudhakar M. Reddy:
A Learning-Based Method to Match a Test Pattern Generator to a Circuit-Under-Test. ITC 1993: 998-1007

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