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"Identification of Defective CMOS Devices Using Correlation and Regression ..."
James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan (1997)
- James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan:
Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data. ITC 1997: 40-49

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