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"Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI."
Mark Paraskeva et al. (1986)
- Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear:
Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. ITC 1986: 232-243
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