"Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI."

Mark Paraskeva et al. (1986)

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type: Conference or Workshop Paper

metadata version: 2002-11-08

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Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear:
Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. ITC 1986: 232-243

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