"Scan Design Oriented Test Technique for VLSI's Using ATE."

Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima (1996)

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DOI: 10.1109/TEST.1996.557055

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima:
Scan Design Oriented Test Technique for VLSI's Using ATE. ITC 1996: 453-460

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