"Redundancy Test for 1 Mbit DRAM Using Multi-Bit-Test Mode."

Yasumasa Nishimura et al. (1986)

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type: Conference or Workshop Paper

metadata version: 2024-11-12

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Yasumasa Nishimura, Mitsuhiro Hamada, Hideto Hidaka, Hideyuki Ozaki, Kazuyasu Fujishima, Y. Hayasaka:
Redundancy Test for 1 Mbit DRAM Using Multi-Bit-Test Mode. ITC 1986: 826-829

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