"Test and repair of large embedded DRAMs. 2."

Eric A. Nelson, Jeffrey H. Dreibelbis, Roderick McConnell (2001)

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DOI: 10.1109/TEST.2001.966631

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Eric A. Nelson, Jeffrey H. Dreibelbis, Roderick McConnell:
Test and repair of large embedded DRAMs. 2. ITC 2001: 173-181

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