"A New Wafer Level Latent Defect Screening Methodology for Highly Reliable ..."

Junghyun Nam et al. (2008)

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DOI: 10.1109/TEST.2008.4700632

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/NamCKKMLJKKSKK08
Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang:
A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. ITC 2008: 1-10

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