"Realizing the Benefits of Structural Test for Intel Microprocessors."

Mike Mayberry et al. (2002)

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DOI: 10.1109/TEST.2002.1041795

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mike Mayberry, John Johnson, Navid Shahriari, Mike Tripp:
Realizing the Benefits of Structural Test for Intel Microprocessors. ITC 2002: 456-463

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