"Estimation of defect-free IDDQ in submicron circuits using switch level ..."

Peter C. Maxwell, Jeff Rearick (1998)

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DOI: 10.1109/TEST.1998.743278

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Peter C. Maxwell, Jeff Rearick:
Estimation of defect-free IDDQ in submicron circuits using switch level simulation. ITC 1998: 882-889

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