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"Cache RAM inductive fault analysis with fab defect modeling."
T. M. Mak et al. (1998)
- T. M. Mak, Debika Bhattacharya, Cheryl Prunty, Bob Roeder, Nermine Ramadan, F. Joel Ferguson, Jianlin Yu:
Cache RAM inductive fault analysis with fab defect modeling. ITC 1998: 862-871
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