default search action
"LSSD Compatible and Concurrently Testable Ram."
Hideshi Maeno et al. (1992)
- Hideshi Maeno, Koji Nii, S. Sakayanagi, S. Kato:
LSSD Compatible and Concurrently Testable Ram. ITC 1992: 608-614
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.