"An Algorithmic Approach to the Testing of a Wafer Scale Integrated (WSI) ..."

Neal H. MacDonald, Gordon B. Neish (1982)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2004-03-30

- no documents available
- export record
  dblp key:
  - conf/itc/MacDonaldN82
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/MacDonaldN82
Neal H. MacDonald, Gordon B. Neish:
An Algorithmic Approach to the Testing of a Wafer Scale Integrated (WSI) Circuit. ITC 1982: 590-600

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.