"Minimal area test points for deterministic patterns."

Yingdi Liu et al. (2016)

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DOI: 10.1109/TEST.2016.7805825

access: closed

type: Conference or Workshop Paper

metadata version: 2018-03-02

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Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer:
Minimal area test points for deterministic patterns. ITC 2016: 1-7

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