"Behavioral Simulation of VLSI Test System Aids Debugging and Analysis of ..."

S. Daniel Lee, Tom Middleton (1984)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-22

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S. Daniel Lee, Tom Middleton:
Behavioral Simulation of VLSI Test System Aids Debugging and Analysis of Test Programs. ITC 1984: 614-620

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