"Latent defect detection in microcontroller embedded flash test using ..."

Andreas Kux et al. (2014)

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DOI: 10.1109/TEST.2014.7035298

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase:
Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. ITC 2014: 1-7

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