"A Sequential Test Generator with Explicit Elimination of Easy-to-Test Faults."

Tsu-Wei Ku, Wei-Kong Chia (1991)

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DOI: 10.1109/TEST.1991.519497

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Tsu-Wei Ku, Wei-Kong Chia:
A Sequential Test Generator with Explicit Elimination of Easy-to-Test Faults. ITC 1991: 83-87

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