"Analysis of Retention Time Distribution of Embedded DRAM - A New Method to ..."

Wei Kong et al. (2008)

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DOI: 10.1109/TEST.2008.4700556

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Wei Kong, Paul C. Parries, G. Wang, Subramanian S. Iyer:
Analysis of Retention Time Distribution of Embedded DRAM - A New Method to Characterize Across-Chip Threshold Voltage Variation. ITC 2008: 1-7

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