"A Test Generation Methodology for High-Performance Computer Chips and Modules."

Bernd Könemann, Phil Noto (1992)

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DOI: 10.1109/TEST.1992.527906

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Bernd Könemann, Phil Noto:
A Test Generation Methodology for High-Performance Computer Chips and Modules. ITC 1992: 826-833

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