"OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of ..."

Suhasini Komarraju et al. (2023)

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DOI: 10.1109/ITC51656.2023.00014

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-09

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Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee:
OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems. ITC 2023: 37-46

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