"Built-in Testing of Memory Using On-chip Compact Testing Scheme."

Kozo Kinoshita, Kewal K. Saluja (1984)

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type: Conference or Workshop Paper

metadata version: 2004-02-19

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Kozo Kinoshita, Kewal K. Saluja:
Built-in Testing of Memory Using On-chip Compact Testing Scheme. ITC 1984: 271-281

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