"At-Speed Interconnect Test and Diagnosis of External Memories on a System."

Heon C. Kim et al. (2004)

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DOI: 10.1109/TEST.2004.1386948

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung:
At-Speed Interconnect Test and Diagnosis of External Memories on a System. ITC 2004: 156-162

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