"Combinational test generation for various classes of acyclic sequential ..."

Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja (2001)

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DOI: 10.1109/TEST.2001.966734

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja:
Combinational test generation for various classes of acyclic sequential circuits. ITC 2001: 1078-1087

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