


default search action
"A Gate-Array-Based 666MHz VLSI Test System."
Shuji Kikuchi et al. (1995)
- Shuji Kikuchi, Yoshihiko Hayashi, Takashi Suga, Jun Saitou, Masahiko Kaneko, Takashi Matsumoto, Ryozou Yoshino:
A Gate-Array-Based 666MHz VLSI Test System. ITC 1995: 451-458

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.