"Multi-GHz loopback testing using MEMs switches and SiGe logic."

David C. Keezer et al. (2007)

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DOI: 10.1109/TEST.2007.4437581

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop:
Multi-GHz loopback testing using MEMs switches and SiGe logic. ITC 2007: 1-10

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