"Removing JTAG Bottlenecks in System Interconnect Test."

Hong Shin Jun, Sung Soo Chung, Sang H. Baeg (2004)

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DOI: 10.1109/TEST.2004.1386950

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Hong Shin Jun, Sung Soo Chung, Sang H. Baeg:
Removing JTAG Bottlenecks in System Interconnect Test. ITC 2004: 173-180

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