"Linearity Testing of Precision Analog-to-Digital Converters Using ..."

Le Jin et al. (2003)

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DOI: 10.1109/TEST.2003.1270843

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger:
Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC 2003: 218-227

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