default search action
"Testing of Precision DACs Using Low-Resolution ADCs with Dithering."
Le Jin et al. (2006)
- Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC 2006: 1-10
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.