"Safely backdriving low voltage devices at in-circuit test."

Chris Jacobsen, Tony Saye, Tom Trader (2005)

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DOI: 10.1109/TEST.2005.1583973

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Chris Jacobsen, Tony Saye, Tom Trader:
Safely backdriving low voltage devices at in-circuit test. ITC 2005: 7

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