"Diagnose compound scan chain and system logic defects."

Yu Huang et al. (2007)

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DOI: 10.1109/TEST.2007.4437578

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Albert Mann:
Diagnose compound scan chain and system logic defects. ITC 2007: 1-10

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