"The Application of Novel Failure Analysis Techniques for Advanced ..."

Yeoh Eng Hong, Martin Tay Tiong We (1997)

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DOI: 10.1109/TEST.1997.639631

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yeoh Eng Hong, Martin Tay Tiong We:
The Application of Novel Failure Analysis Techniques for Advanced Multi-Layered CMOS Devices. ITC 1997: 304-309

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