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"Extraction, Simulation and Test Generation for Interconnect Open Defects ..."
Stefan Hillebrecht et al. (2008)
- Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng:
Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. ITC 2008: 1-10
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