"Economic Impact of Type I Test Errors at System and Board Levels."

Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins (1992)

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DOI: 10.1109/TEST.1992.527855

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins:
Economic Impact of Type I Test Errors at System and Board Levels. ITC 1992: 444-452

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