"An Approach to Chip-Internal Current Monitoring and Measurement Using an ..."

Klaus Helmreich et al. (1991)

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DOI: 10.1109/TEST.1991.519517

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Klaus Helmreich, Peter Nagel, Werner Wolz, Klaus D. Müller-Glaser:
An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester. ITC 1991: 256-262

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