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"Enhanced Delay Test Generator for High-Speed Logic LSIs."
Kazumi Hatayama et al. (1989)
- Kazumi Hatayama, Mitsuji Ikeda, Terumine Hayashi, Masahiro Takakura, Kuniaki Kishida, Shun Ishiyama:
Enhanced Delay Test Generator for High-Speed Logic LSIs. ITC 1989: 161-165
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