"Testing Conventional Logic and Memory Clusters Using Boundary Scan Devices ..."

Peter Hansen (1989)

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DOI: 10.1109/TEST.1989.82291

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Peter Hansen:
Testing Conventional Logic and Memory Clusters Using Boundary Scan Devices as Virtual ATE Channels. ITC 1989: 166-173

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